Reflection Electron Microscopy and Spectroscopy for Surface Analysis

by Wang, Zhong Lin
3.7 out of 5 Customer Rating
ISBN: 9780521482660

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This book is a comprehensive review of the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS). The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy-loss spectra in different scattering geometries. This and many other features makes the book an important and timely addition to the materials science literature for researchers and graduate students in physics and materials science.
  • Format: Hardcover
  • Author: Wang, Zhong Lin
  • ISBN: 9780521482660
  • Condition: Used
  • Dimensions: 9.99 x 1.11
  • Number Of Pages: 458
  • Publication Year: 2015

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